A Method for Improving YOLOv5 Strip Surface Defect Detection

YU Longfei, LIU Yefeng, HE Zengpeng, MA Yihang

Control Engineering of China ›› 2025, Vol. 32 ›› Issue (2) : 377-384.

Control Engineering of China ›› 2025, Vol. 32 ›› Issue (2) : 377-384.

A Method for Improving YOLOv5 Strip Surface Defect Detection

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 32(2): 377-384

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail
Sections
Recommended
京ICP备05021913号-100
Copyright © Control Engineering of China, All Rights Reserved.
Tel: 024-23883498（传真），024-83688973-16/17/18　
E-mail：kzgcbjb@mail.neu.edu.cn
Powered by Beijing Magtech Co. Ltd.

/

〈 〉